Beilstein J. Nanotechnol.2013,4, 510–516, doi:10.3762/bjnano.4.60
are fluorescently labeled to a low degree. The simultaneous recording of topography and fluorescence data allows for the exact localization of distinct building blocks within the superordinate structures.
Keywords: aperturelessscanningnear-fieldopticalmicroscope; atomic force microscopy
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Figure 1:
AFM topography scans of desmin filaments under ambient conditions. a) Filaments assembled from wild...